Inventor
Changting Wang
Inventor
Niskayuna, NY, US
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
G06FElectric digital data processing7%
H01FMagnets5%
H04LTransmission of digital information, e.g. telegraphic communication5%
Y10TTechnical subjects covered by former us classification5%
B29CShaping or joining of plastics3%
B29KIndexing scheme associated with subclasses b29b, b29c or b29d, relating to moulding materials or to materials for moulds, reinforcements, fillers or preformed parts, e.g. inserts3%
G01RMeasuring electric variables3%
H01HElectric switches3%
H02HEmergency protective circuit arrangements3%
PatentTitleYear
10,988,843System for determining cleaning process endpoint202110,324,896Method and apparatus for acquiring resource20199,759,686'Magnetic inspection systems for inspection of target objects'20178,884,614'Eddy current array probe'20148,710,834'Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probe'20148,436,608'Eddy current inspection system and method'20138,378,668'Method for non-destructive testing of composite systems'20138,269,489'System and method for eddy current inspection of parts with complex geometries'20128,179,132'Method and system for integrating eddy current inspection with a coordinate measuring device'20127,994,780'System and method for inspection of parts with an eddy current probe'20117,952,348'Flexible eddy current array probe and methods of assembling the same'20117,948,233'Omnidirectional eddy current array probes and methods of use'20117,888,932'Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same'20117,817,845'Multi-frequency image processing for inspecting parts having complex geometric shapes'20107,518,359'Inspection of non-planar parts using multifrequency eddy current with phase analysis'20097,402,999'Pulsed eddy current pipeline inspection system and method'20087,206,706'Inspection method and system using multifrequency phase analysis'20077,154,265'Eddy current probe and inspection method'20067,015,690'Omnidirectional eddy current probe and inspection system'20067,005,851'Methods and apparatus for inspection utilizing pulsed eddy current'20066,999,291'Method and apparatus for node electronics unit architecture'20066,892,115'Method and apparatus for optimized centralized critical control architecture for switchgear and power equipment'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2017Patents assigned to GEN ELECTRIC (20)· patent assignee history
2005–2006Based in Schenectady, NY, US· patent location history
2007–2014Based in Niskayuna, NY, US· patent location history
2012–2014Patents assigned to WANG CHANGTING (6)· patent assignee history
2013–2014Patents assigned to SHEILA-VADDE APARNA CHAKRAPANI (4)· patent assignee history
2013–2014Patents assigned to FAIDI WASEEM IBRAHIM (2)· patent assignee history
2014Patents assigned to GODBOLE MANDAR DIWAKAR (2)· patent assignee history
2017Based in Palo Alto, CA, US· patent location history
2019Based in Shenzhen, CN· patent location history
2021Based in Andover, MA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 20 | 2005–2017 |
| WANG CHANGTINGself | 6 | 2012–2014 |
| SHEILA-VADDE APARNA CHAKRAPANI | 4 | 2013–2014 |
| FAIDI WASEEM IBRAHIM | 2 | 2013–2014 |
| GODBOLE MANDAR DIWAKAR | 2 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 13 | 2007–2014 |
| Schenectady, New York, US | 5 | 2005–2006 |
| Andover, Massachusetts, US | 1 | 2021 |
| Shenzhen, CN | 1 | 2019 |
| Palo Alto, California, US | 1 | 2017 |