Infrared temperature measurement device
Granted 18 Jul 2023 · no office action yet
Assignee: CHANGZHOU HUADA KEJIE OPTO-ELECTRO INSTRUMENT CO., LTD
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Yiting Pan, Ou Zhang · Examiner: Antoine Duval Davis · AU 2917 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a front view of an…
FIG. 1 is a front view of an infrared temperature measurement device in accordance with the present invention;
FIG. 2 is rear view of the infrared temperature measurement device of FIG. 1 ;
FIG. 3 is a left view of the infrared temperature measurement device of FIG. 1 ;
FIG. 4 is a right view of the infrared temperature measurement device of FIG. 1 ;
FIG. 5 is a top view of the infrared temperature measurement device of FIG. 1 ;
FIG. 6 is a bottom view of the infrared temperature measurement device of FIG. 1 ;
FIG. 7 is a first stereoscopic view of the infrared temperature measurement device of FIG. 1 ; and,
FIG. 8 is a second stereoscopic view of the infrared temperature measurement device of FIG. 1 .
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2 members · 2 offices›IP5 & PCT — 2 members
| Office | Publication | Kind | Published | Filed | Status | Title |
|---|---|---|---|---|---|---|
| USthis patent | US-D992434-S | S1 | 18 Jul 2023 | 20 Aug 2021 | granted | Infrared temperature measurement device |
| JP | JP-1714283-S | S | 9 May 2022 | 19 Aug 2021 | granted | 赤外線温度測定装置ja |
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