Sample holder for ionized sample analysis

FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged view showing a portion of FIG. 1 defined by lines 9 - 9 and 9 ′- 9 ′;

FIG. 10 is an enlarged view showing a portion of FIG. 4 defined by line 10 - 10 ;

FIG. 11 is an enlarged view showing a portion of FIG. 7 defined by lines 11 - 11 and 11 ′- 11 ′;

FIG. 12 is an enlarged view showing a portion of FIG. 8 defined by lines 12 - 12 and 12 ′- 12 ′;

FIG. 13 is an enlarged cross-sectional view along the line 13 - 13 in FIG. 10 , in the area designated by 13 ′- 13 ′ in FIG. 9 ;

FIG. 14 is an enlarged cross-sectional view along the line 14 - 14 in FIG. 10 , in the area designated by 14 ′- 14 ′ in FIG. 9 ;

FIG. 15 is an enlarged cross-sectional view along the line 15 - 15 in FIG. 10 , in the area designated by 15 ′- 15 ′ in FIG. 9 ; and,

FIG. 16 is an enlarged cross-sectional view along the line 16 - 16 in FIG. 10 , in the area designated by 16 ′- 16 ′ in FIG. 9 .

The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.