USPatentGranted
S1

Electrical tester

Granted 10 Mar 2020 · no office action yet

Current assignee: Fluke Corporation · originally Fortive

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Ferdinand Y. Laurino, Brian S. Aikins, Paul A. Richer · Examiner: Antoine Duval Davis · AU 2917 · TC 2900

Application
29/687,513
filed 12 Apr 2019
Publication
Not published
not published
Patent· this page
US D877634
granted 10 Mar 2020

Life of the patent

2 dated events
⤢ drag to zoomApr 2019Jul 2019Oct 2019Jan 2020Apr 2020Prosecution
Prosecutionhover for detail · click to open

Description

1 parts
›FIG. 1 is a bottom, front right perspective…

FIG. 1 is a bottom, front right perspective view of an electrical tester showing our new design.

FIG. 2 is a top, rear left perspective view thereof.

FIG. 3 is a front elevation view thereof.

FIG. 4 is a right side elevation view thereof.

FIG. 5 is a left side elevation view thereof.

FIG. 6 is a rear elevation view thereof.

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a top plan view thereof.

The broken lines in the figures illustrate portions of the electrical tester that form no part of the claimed design.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D10/78

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency
0.9 y
333 days filing → grant
Office actions
0
none on record
Examiner
Antoine Duval Davis
art unit 2917 · TC 2900
Citations: 5 back · 0 forward

See the full prosecution history — every USPTO and applicant action on this file, in order.

Log in to unlock

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Worldwide family

4 members · 2 offices
US2JP2
this patentIP5 & PCTother officessolid = grantedhover for detail · click to open
Members
4
DOCDB simple family 63168778
Offices
2
US · JP
Granted
4 of 4
grant date present
›IP5 & PCT — 4 members
OfficePublicationKindPublishedFiledStatusTitle
USUS-D849576-SS128 May 20191 Sep 2017grantedElectrical tester
USthis patentUS-D877634-SS110 Mar 202012 Apr 2019grantedElectrical tester
JPJP-1611618-SS20 Aug 201828 Feb 2018grantedno title held
JPJP-1611619-SS20 Aug 201828 Feb 2018grantedno title held

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock