Oven display screen with a graphical user interface
Granted 12 May 2015 · 2 office actions
Assignee: Samsung Electronics
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Joonho Lee, Joon-Taek Lee, Yekyung Yoo · Examiner: Philip S Hyder · AU 2914 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a front view of an…
FIG. 1 is a front view of an oven display screen with a graphical user interface showing our new design;
FIG. 2 is a front view thereof showing our new design in a second state;
FIG. 3 is a front view thereof showing our new design in a third state;
FIG. 4 is a front view thereof showing our new design in a fourth state;
FIG. 5 is an enlarged front view of the oven display screen with a graphical user interface as shown in FIG. 1 ;
FIG. 6 is an enlarged front view of FIG. 2 ;
FIG. 7 is an enlarged front view of FIG. 3 ; and,
FIG. 8 is an enlarged front view of FIG. 4 .
The appearance of the transitional image sequentially transitions between the images shown in FIGS. 1-4 and FIGS. 5-8 . The process or period in which one image transitions to another image forms no part of the claimed design.
The broken line showing of the oven is included for the purpose of illustrating environmental structure associated with the oven display screen with a graphical user interface and forms no part of the claimed design.
Claims
1 · 1 independent · depth 1Classifications
1 codesClaim changes
SoonSee which claims were amended, added or cancelled during examination, with every added and removed word marked.
The published claims of this patent are not paired with the granted ones in what we hold.
File wrapper
See the full prosecution history — every USPTO and applicant action on this file, in order.
Log in to unlockChain of title
See the full assignment history — every owner this patent has passed through, with recordation dates and reel/frame numbers.
Log in to unlockTerm & fees
See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.
Log in to unlockValidity challenges
See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.
Log in to unlockCitations
See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.
Log in to unlock