FIG. 1 is a perspective view of an electrical test probe probing head with the probing head angled slightly away from the viewer showing the new design, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and form no part of the claimed design.

FIG. 2 is a perspective view of an electrical test probe probing head with the probing head angled slightly towards the viewer showing the new design, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and form no part of the claimed design.

FIG. 3 is a left side view of the electrical test probe probing head, the left right view being a mirror image thereof, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.

FIG. 4 is a top view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.

FIG. 5 is a front view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design,

FIG. 6 is a back view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design; and,

FIG. 7 is a bottom view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1

1 granted claims

›1.independentThe ornamental design for an electrical test probe probing head, as shown and described.

Classifications

1 codes

USPC · US Patent Classification

D10/80

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344 days filing → grant

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Examiner

Antoine Duval Davis

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