USPatentGranted
S

Halogen gas leak detector

Granted 18 Oct 1988 · no office action yet

Assignee: Yokogawa Electric

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Kazuhiro Kawano · Examiner: Nelson C. Holtje · AU 292 · TC 2900

Application
819193
filed 15 Jan 1986
Publication
Not published
not published
Patent· this page
US D298110
granted 18 Oct 1988

Life of the patent

2 dated events
⤢ drag to zoomJan 1986Jul 1986Jan 1987Jul 1987Jan 1988Jul 1988Prosecution
Prosecutionhover for detail · click to open

Description

1 parts
›FIG. 1 is a top and left front…

FIG. 1 is a top and left front perspective view of a halogen gas leak detector showing my new design;

FIG. 2 is a bottom and right rear perspective view thereof;

FIG. 3 is a top and left front perspective view thereof with the flexible probe tube in an extended position.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

2 codes
USPC · US Patent Classification
D10/46D10/81

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency
2.8 y
1,007 days filing → grant
Office actions
0
on the grant's record
Examiner
Nelson C. Holtje
art unit 292 · TC 2900
Citations: 2 back · 0 forward

Chain of title

⤢ drag to zoom19861988199019921994199619982000200220042006Owner 2
Titlehover for detail · click to open

See the full assignment history — every owner this patent has passed through, with recordation dates and reel/frame numbers.

Log in to unlock

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock