Particle measurement device
Granted 24 Dec 2024 · 2 office actions
Current assignee: Dongwoo Fine-Chem Co., Ltd. · originally Sumitomo Chemical
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Su-Yeon Oh, Seung Pil Han, Young-Hoon Kim, Min Ju Lee · Examiner: Antoine Duval Davis · AU 2917 · TC 2900
Life of the patent
7 dated eventsDescription
1 parts›FIG. 1 is a perspective view illustrating a…
FIG. 1 is a perspective view illustrating a mount and a resonance unit assembled into a particle measurement device of the present design;
FIG. 2 is an exploded view of the mount and the resonance unit of a particle measurement device of the present design;
FIG. 3 is a front view illustrating the particle measurement device of the present design;
FIG. 4 is a rear view illustrating the particle measurement device of the present design;
FIG. 5 is a left side view illustrating the particle measurement device of the present design;
FIG. 6 is a right side view illustrating the particle measurement device of the present design;
FIG. 7 is a plan view illustrating the particle measurement device of the present design;
FIG. 8 is a bottom view illustrating the particle measurement device of the present design;
FIG. 9 is a perspective view of a mount included in the particle measurement device;
FIG. 10 is a front view of the mount;
FIG. 11 is a rear view of the mount;
FIG. 12 is a left side view of the mount;
FIG. 13 is a right side view of the mount;
FIG. 14 is a plan view of the mount;
FIG. 15 is a bottom view of the mount;
FIG. 16 is a perspective view of a resonance unit included in the particle measurement device;
FIG. 17 is a front view of the resonance unit;
FIG. 18 is a rear view of the resonance unit;
FIG. 19 is a left side view of the resonance unit;
FIG. 20 is a right side view of the resonance unit;
FIG. 21 is a plan view of the resonance unit; and,
FIG. 22 is a bottom view of the resonance unit.
Claims
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3 members · 3 offices›IP5 & PCT — 2 members
| Office | Publication | Kind | Published | Filed | Status | Title |
|---|---|---|---|---|---|---|
| USthis patent | US-D1054882-S | S1 | 24 Dec 2024 | 13 Apr 2022 | granted | Particle measurement device |
| JP | JP-1719190-S | S | 6 Jul 2022 | 13 Apr 2022 | granted | 粒子測定機構ja |
›Other offices — 1 members
| Office | Publication | Kind | Published | Filed | Status | Title |
|---|---|---|---|---|---|---|
| TW | TW-D224210-S | S | 11 Mar 2023 | 13 May 2022 | published | 粒子測量裝置zh |
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