Sample holder for ionized sample analysis
Granted 23 Nov 2021 · no office action yet
Assignee: Hamamatsu Photonics
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Masahiro Kotani, Takayuki Ohmura · Examiner: Omeed Agilee · AU 2924 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a front view of a…
FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;
FIG. 2 is a rear view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a left side view thereof;
FIG. 7 is a perspective view thereof;
FIG. 8 is an enlarged view showing a portion of FIG. 1 defined by lines 8 - 8 and 8 ′- 8 ′;
FIG. 9 is an enlarged view showing a portion of FIG. 4 defined by line 9 - 9 ;
FIG. 10 is an enlarged view showing a portion of FIG. 7 defined by lines 10 - 10 and 10 ′- 10 ′;
FIG. 11 is an enlarged cross-sectional view along the line 11 - 11 in FIG. 9 , in the area designated by 11 ′- 11 ′ in FIG. 8 ;
FIG. 12 is an enlarged cross-sectional view along the line 12 - 12 in FIG. 9 , in the area designated by 12 ′- 12 ′ in FIG. 8 ;
FIG. 13 is an enlarged cross-sectional view along the line 13 - 13 in FIG. 9 , in the area designated by 13 ′- 13 ′ in FIG. 8 ; and,
FIG. 14 is an enlarged cross-sectional view along the line 14 - 14 in FIG. 9 , in the area designated by 14 ′- 14 ′ in FIG. 8 .
The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.
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