USPatentGranted
S1

Front panel for a measurement instrument

Granted 12 Jun 2018 · no office action yet

Current assignee: Tektronix Inc. · originally Fortive

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Inventors: Gary J. Waldo, Jared Randall, Phelan W. Miller, Joshua M. Kornfeld +7 · Examiner: Antoine Duval Davis · AU 2917 · TC 2900

Application
29/603,725
filed 11 May 2017
Publication
Not published
not published
Patent· this page
US D820129
granted 12 Jun 2018

Life of the patent

5 dated events
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Description

1 parts
›FIG. 1 is a front left perspective view…

FIG. 1 is a front left perspective view of a test and measurement instrument incorporating the ornamental design of the front panel.

FIG. 2 is a front right perspective view of the front panel for a measurement instrument of FIG. 1 .

FIG. 3 is a front elevation view of the front panel for a measurement instrument of FIG. 1 . FIG. 3A is an enlarged view of the arrangement of the controls of the of the front panel for a measurement instrument of FIG. 1 .

FIG. 4 is a right-side elevation of the front panel for a measurement instrument of FIG. 1 .

FIG. 5 is a left-side elevation of the front panel for a measurement instrument of FIG. 1 .

FIG. 6 is a top plan view of the front panel for a measurement instrument of FIG. 1 ; and,

FIG. 7 is a bottom plan view of the front panel for a measurement instrument of FIG. 1 .

The portions of the front panel for a measurement instrument shown in broken lines form no part of the claimed design.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

2 codes
USPC · US Patent Classification
D10/80D10/103

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File wrapper

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Pendency
1.1 y
397 days filing → grant
Office actions
0
none on record
Examiner
Antoine Duval Davis
art unit 2917 · TC 2900
Citations: 30 back · 0 forward

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Chain of title

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Citations

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