USPatentGranted
S1

Plane depth gauge

Granted 31 Mar 2015 · no office action yet

Assignee: Yanchen Zhang

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Yanchen Zhang, Meng Zhang · Examiner: Antoine D Davis · AU 2917 · TC 2900

Application
29/479,731
filed 18 Jan 2014
Publication
Not published
not published
Patent· this page
US D725515
granted 31 Mar 2015

Life of the patent

2 dated events
⤢ drag to zoomJan 2014Apr 2014Jul 2014Oct 2014Jan 2015Apr 2015Prosecution
Prosecutionhover for detail · click to open

Description

1 parts
›FIG. 1 is a top, left perspective view…

FIG. 1 is a top, left perspective view of a plane depth gauge showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a rear end view thereof; and,

FIG. 7 is a head on view thereof.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D10/74

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency
1.2 y
437 days filing → grant
Office actions
0
none on record
Examiner
Antoine D Davis
art unit 2917 · TC 2900
Citations: 9 back · 0 forward

See the full prosecution history — every USPTO and applicant action on this file, in order.

Log in to unlock

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock