USPatentGranted
S1

Analytical instrument

Granted 2 Jul 2013 · 2 office actions

Assignee: Mettler Toledo

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Inventors: Patrick Ammon, Chong Zhu, Yves Marmier · Examiner: Antoine D Davis · AU 2917 · TC 2900

Application
29/439,857
filed 17 Dec 2012
Publication
Not published
not published
Patent· this page
US D685277
granted 2 Jul 2013

Life of the patent

8 dated events
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Description

1 parts
›FIG. 1 is a front perspective view of…

FIG. 1 is a front perspective view of a first embodiment of the analytical instrument, with broken lining on a surface showing functional elements that are not considered part of the design;

FIG. 2 is a front elevation view of the FIG. 1 device;

FIG. 3 is a top plan view of the FIG. 1 device;

FIG. 4 is a bottom plan view of the FIG. 1 device;

FIG. 5 is a left side elevation view of the FIG. 1 device;

FIG. 6 is a right side elevation view of the FIG. 1 device;

FIG. 7 is a rear elevation plan view of the FIG. 1 device, the broken lining showing operational elements that are not considered part of the design;

FIG. 8 is a front perspective view of the FIG. 1 device with a cover removed, the broken lining showing both the functional elements and the operational elements;

FIG. 9 is a front elevation view of the FIG. 8 device;

FIG. 10 is a top plan view of the FIG. 8 device;

FIG. 11 is a left side elevation view of the FIG. 8 device;

FIG. 12 is a right side elevation view of the FIG. 8 device; and,

FIG. 13 is a rear elevation plan view of the FIG. 8 device.

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Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D10/81

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File wrapper

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Pendency
0.5 y
197 days filing → grant
Office actions
1
non-final + final
Responses
1
no RCE
Examiner
Antoine D Davis
art unit 2917 · TC 2900
Citations: 11 back · 0 forward

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Chain of title

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Term & fees

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Validity challenges

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Citations

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