Fixation device for a sample case for an electron microscope
Granted 22 May 2012 · 2 office actions
Assignee: Hitachi, Ltd.
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Yasuhira Nagakubo, Katsuji Itou, Hideki Hirota, Takayuki Asakawa +1 · Examiner: Paula Greene · AU 2912 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a front, top and right…
FIG. 1 is a front, top and right side perspective view of a fixation device for a sample case for an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
Claims
1 · 1 independent · depth 1Classifications
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2 members · 2 offices›IP5 & PCT — 1 members
| Office | Publication | Kind | Published | Filed | Status | Title |
|---|---|---|---|---|---|---|
| USthis patent | US-D660335-S | S1 | 22 May 2012 | 31 Jan 2011 | granted | Fixation device for a sample case for an electron microscope |
›Other offices — 1 members
| Office | Publication | Kind | Published | Filed | Status | Title |
|---|---|---|---|---|---|---|
| TW | TW-D143622-S1 | S1 | 1 Nov 2011 | 26 Jan 2011 | published | 電子顯微鏡用試料盒固定具zh |
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