USPatentGranted
S

Electronic test and measurement instrument

Granted 14 Sep 1999 · no office action yet

Current assignee: Tektronix, Inc. · originally Fortive

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Inventors: Kenneth P. Dobyns, Scott Ketterer, William R. Pooley · Examiner: Antoine Duval Davis · AU 293 · TC 2900

Application
Not granted yet
filed 28 Jul 1998
Publication
Not published
not published
Patent· this page
US D413823
granted 14 Sep 1999

Life of the patent

2 dated events
⤢ drag to zoomJul 1998Oct 1998Jan 1999Apr 1999Jul 1999Oct 1999Prosecution
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Description

1 parts
›FIG. 1 is a perspective view of the…

FIG. 1 is a perspective view of the electronic test and measurement instrument showing our new design;

FIG. 2 is a front elevation view of the instrument showing in dotted lines an example of front panel knobs and buttons which may be used with the subject design;

FIG. 3 is a right side elevation view of the instrument;

FIG. 4 is a left side elevation view of the instrument;

FIG. 5 is a top end elevation view of the instrument;

FIG. 6 is a bottom end elevation view of the instrument;

FIG. 7 is a back elevation view of the instrument; and,

FIG. 8 is a front elevation view of the instrument.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D10/76

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Pendency
1.1 y
413 days filing → grant
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Examiner
Antoine Duval Davis
art unit 293 · TC 2900
Citations: 3 back · 0 forward

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