Circuit tester
Granted 27 Jul 1999 · no office action yet
Current assignee: Kaise Kabushiki Kaisha · originally KAISE CO., LTD.
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Attorney: Attorney · Log in to unlock
Inventors: Hideo Kaise, Masazo Murase · Examiner: Antoine Duval Davis · AU 293 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a perspective view of a…
FIG. 1 is a perspective view of a circuit tester showing my new design;
FIG. 2 is a perspective view thereof with the cover thereof closed;
FIG. 3 is a perspective view thereof with the test leads thereof pulled out;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a left side elevational view thereof;
FIG. 9 is a right side elevational view thereof;
FIG. 10 is a front elevational view thereof with the cover thereof closed;
FIG. 11 is a rear elevational view thereof with the cover thereof closed;
FIG. 12 is a top plan view thereof with the cover thereof closed;
FIG. 13 is a bottom plan view thereof with the cover thereof closed;
FIG. 14 is a left side elevational view thereof with the cover thereof closed;
FIG. 15 is a right side elevational view thereof with the cover thereof closed;
FIG. 16 is a front elevational view thereof in which the cover is turned until reaching a rear face of a body proper; and,
FIG. 17 is a bottom plan view thereof in which the cover is turned until reaching the rear face of the body proper.
Claims
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