USPatentGranted

Electronic thermometer probe

Granted 13 Nov 1990 · no office action yet

Current assignee: TERUMO KABUSHIKI KAISHA · originally Terumo Corporation

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Inventors: Kenichi Kida, Tetsuya Ide · Examiner: Nelson C. Holtje · AU 293 · TC 2900

Application

152582

filed 5 Feb 1988

Publication

Not published

not published

Patent· this page

US D312047

granted 13 Nov 1990

term adjustment not held

none

Litigation

checked

1 recorded conveyances

Life of the patent

2 dated events

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Description

1 parts

›FIG. 1 is a front elevational view of…

FIG. 1 is a front elevational view of a electronic thermometer probe showing our new design;

FIG. 2 is a left side elevational view;

FIG. 3 is a right side elevational view;

FIG. 4 is a rear elevational view;

FIG. 5 is a top plan view;

FIG. 6 is a bottom plan view; and

FIG. 7 is a cross-sectional view taken along line 7--7 of FIG. 1 thereof.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1

1 granted claims

›1.independentThe ornamental design for a electronic thermometer probe, as shown.

Classifications

1 codes

USPC · US Patent Classification

D10/60

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Pendency

2.8 y

1,012 days filing → grant

Office actions

on the grant's record

Examiner

Nelson C. Holtje

art unit 293 · TC 2900

Law firm

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Citations: 6 back · 0 forward

Chain of title

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Worldwide family

2 members · 2 offices

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Members

DOCDB simple family 64290046

Offices

Granted

1 of 2

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›IP5 & PCT — 1 members

Office	Publication	Kind	Published	Filed	Status	Title
USthis patent	US-D312047-S	S	13 Nov 1990	5 Feb 1988	granted	Electronic thermometer probe

›Other offices — 1 members

Office	Publication	Kind	Published	Filed	Status	Title
AU	AU-104981-S	S	30 Aug 1989	17 Mar 1988	published	A probe for an electric thermometer

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Citations

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