USPatentGranted

Electronic thermometer probe

Granted 30 Oct 1990 · no office action yet

Current assignee: TERUMO KABUSHIKI KAISHA · originally Terumo Corporation

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Tetsuya Ide, Kenichi Kida · Examiner: Nelson C. Holtje · AU 293 · TC 2900

Application

152580

filed 5 Feb 1988

Publication

Not published

not published

Patent· this page

US D311696

granted 30 Oct 1990

term adjustment not held

none

Litigation

checked

1 recorded conveyances

Life of the patent

2 dated events

⤢ drag to zoom

Prosecutionhover for detail · click to open

Description

1 parts

›FIG. 1 is a front elevational view of…

FIG. 1 is a front elevational view of an electronic thermometer probe showing our new design;

FIG. 2 is a top plan view, the bottom plan view being identical;

FIG. 3 is a rear elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a right side elevational view; and

FIG. 6 is a cross-sectional view taken along line 6--6 of FIG. 1 thereof.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1

1 granted claims

›1.independentThe ornamental design for an electronic probe, as shown and described.

Classifications

1 codes

USPC · US Patent Classification

D10/60

Claim changes

Soon

Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency

2.7 y

998 days filing → grant

Office actions

on the grant's record

Examiner

Nelson C. Holtje

art unit 293 · TC 2900

Law firm

Law firm · Log in to unlock

Citations: 6 back · 0 forward

Chain of title

⤢ drag to zoom

Titlehover for detail · click to open

See the full assignment history — every owner this patent has passed through, with recordation dates and reel/frame numbers.

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Worldwide family

2 members · 2 offices

this patentIP5 & PCTother officessolid = grantedhover for detail · click to open

Members

DOCDB simple family 64271386

Offices

Granted

1 of 2

grant date present

›IP5 & PCT — 1 members

Office	Publication	Kind	Published	Filed	Status	Title
USthis patent	US-D311696-S	S	30 Oct 1990	5 Feb 1988	granted	Electronic thermometer probe

›Other offices — 1 members

Office	Publication	Kind	Published	Filed	Status	Title
AU	AU-104982-S	S	30 Aug 1989	17 Mar 1988	published	A probe for an electronic thermometer

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.