USPatentGranted
S

Combined billing and controller terminal for filling stations

Granted 26 Oct 1982 · no office action yet

Assignee: Sharp Corporation

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Masaji Sawada, Tsutomu Yamasaki · Examiner: B. J. Bullock · AU 291 · TC 2900

Application
157240
filed 6 Jun 1980
Publication
Not published
not published
Patent· this page
US D266669
granted 26 Oct 1982

Life of the patent

2 dated events
⤢ drag to zoomJul 1980Oct 1980Jan 1981Apr 1981Jul 1981Oct 1981Jan 1982Apr 1982Jul 1982Oct 1982Prosecution
Prosecutionhover for detail · click to open

Description

1 parts
›FIG. 1 is a perspective view of the…

FIG. 1 is a perspective view of the combined billing and controller terminal for filling stations showing our new design with the cover open;

FIG. 2 is a front elevational view thereof with the cover open;

FIG. 3 is a front elevational view thereof with the cover closed;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a side elevational view taken from the left of FIG. 1;

FIG. 6 is a side elevational view taken from the right of FIG. 1;

FIG. 7 is a top view thereof; and

FIG. 8 is a bottom view thereof.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

4 codes
USPC · US Patent Classification
D14/102D06/25D06/167D14/105

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency
2.4 y
872 days filing → grant
Office actions
0
on the grant's record
Examiner
B. J. Bullock
art unit 291 · TC 2900
Citations: 1 back · 0 forward

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock