USPatentGranted
S

Electronic calculating machine

Granted 7 Feb 1978 · no office action yet

Current assignee: Sharp Kabushiki Kaisha · originally Sharp Corporation

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Yoshihisa Ohie · Examiner: Susan J. Lucas · AU 291 · TC 2900

Application
710335
filed 30 Jul 1976
Publication
Not published
not published
Patent· this page
US D247198
granted 7 Feb 1978

Life of the patent

3 dated events
⤢ drag to zoom19761978198019821984198619881990199219941996ProsecutionTerm & fees
ProsecutionTerm & feeshover for detail · click to open

Description

1 parts
›FIG. 1 is a perspective view of the…

FIG. 1 is a perspective view of the electronic calculating machine showing my new design;

FIG. 2 is a plan view thereof on a reduced scale;

FIG. 3 is a front elevational view thereof on a reduced scale;

FIG. 4 is a right side elevational view thereof on a reduced scale;

FIG. 5 is a left side elevational view thereof on a reduced scale;

FIG. 6 is a rear elevational view thereof on a reduced scale; and

FIG. 7 is a bottom view thereof on a reduced scale.

The indicia are shown in broken lines in FIG. 1 for illustrative purposes only.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D64/11.B

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency
1.5 y
557 days filing → grant
Office actions
0
on the grant's record
Examiner
Susan J. Lucas
art unit 291 · TC 2900
Citations: 1 back · 0 forward

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock