Semiconductor device
Granted 26 Apr 2016 · 2 office actions
Assignee: Semiconductor Energy Laboratory
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Shunpei Yamazaki, Shinpei Matsuda, Kenichi Okazaki, Hiroyuki Miyake +1 · Examiner: Fernando L Toledo · AU 2897 · TC 2800
Life of the patent
9 dated eventsAbstract
A semiconductor device including a transistor having excellent electrical characteristics is provided. Alternatively, a semiconductor device having a high aperture ratio and including a capacitor capable of increasing capacitance is provided. The semiconductor device includes a gate electrode, an oxide semiconductor film overlapping the gate electrode, an oxide insulating film in contact with the oxide semiconductor film, a first oxygen barrier film between the gate electrode and the oxide semiconductor film, and a second oxygen barrier film in contact with the first oxygen barrier film. The oxide semiconductor film and the oxide insulating film are provided on an inner side of the first oxygen barrier film and the second oxygen barrier film.
Claims
20 · 3 independent · depth 3Classifications
3 codes- H01L29/786
- H01L29/49
- H01L27/12
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20140339539 A1 | 20 Nov 2014 |
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