USPatentGranted
B2

Semiconductor device

Granted 26 Apr 2016 · 2 office actions

Life of the patent

9 dated events
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Abstract

A semiconductor device including a transistor having excellent electrical characteristics is provided. Alternatively, a semiconductor device having a high aperture ratio and including a capacitor capable of increasing capacitance is provided. The semiconductor device includes a gate electrode, an oxide semiconductor film overlapping the gate electrode, an oxide insulating film in contact with the oxide semiconductor film, a first oxygen barrier film between the gate electrode and the oxide semiconductor film, and a second oxygen barrier film in contact with the first oxygen barrier film. The oxide semiconductor film and the oxide insulating film are provided on an inner side of the first oxygen barrier film and the second oxygen barrier film.

Claims

20 · 3 independent · depth 3
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20 granted claims

Classifications

3 codes
IPC · International Patent Classification
Section H — Electricity
  • H01L29/786
  • H01L29/49
  • H01L27/12

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File wrapper

⤢ drag to zoomApr 2014Jul 2014Oct 2014Jan 2015Apr 2015Jul 2015Oct 2015Jan 2016Apr 2016USPTOApplicantNon-final rejectionResponse after non-finalRequest for continued examination
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Pendency
2.0 y
719 days filing → grant
Office actions
1
non-final + final
Responses
1
1 RCE
Examiner
Fernando L Toledo
art unit 2897 · TC 2800
Citations: 236 back · 0 forward

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Term & fees

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20140339539 A120 Nov 2014

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