USPatentGranted
B2

Charged particle beam drawing apparatus and drawing chamber

Granted 20 Oct 2015 · no office action yet

Assignee: NuFlare Technology, Inc.

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Inventors: Yoshinori Nakagawa, Seiichi Nakazawa, Hiroyasu Saito · Examiner: Nicole Ippolito · AU 2881 · TC 2800

Life of the patent

3 dated events
⤢ drag to zoomJul 2014Oct 2014Jan 2015Apr 2015Jul 2015Oct 2015Prosecution
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Abstract

A charged particle beam drawing apparatus includes: a stage configured to support a specimen as a drawing target; and an airtight drawing chamber formed into a box shape provided with a side wall and a bottom plate, and configured to house the stage. The bottom plate includes: multiple support portions connected to the side wall and configured to support the stage; and a curved portion connected to the support portions and having a convex shape curved outward.

Claims

20 · 2 independent · depth 4
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20 granted claims

Classifications

3 codes
IPC · International Patent Classification
Section H — Electricity
  • H01J37/16
  • H01J37/317
  • H01J37/20

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File wrapper

Pendency
1.3 y
468 days filing → grant
Office actions
0
none on record
Examiner
Nicole Ippolito
art unit 2881 · TC 2800
Citations: 1 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20150021495 A122 Jan 2015

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