USPatentGranted
B2

Touch trigger measurement probe

Granted 1 Sep 2015 · 2 office actions

Current assignee: RENISHAW PLC · originally Renishaw Plc

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Inventors: Robert Charles D'Olier Umfreville, Michael John Wooldridge, Peter Kenneth Hellier · Examiner: Bryan Bui · AU 2865 · TC 2800

Life of the patent

3 dated events
⤢ drag to zoomJan 2014Apr 2014Jul 2014Oct 2014Jan 2015Apr 2015Jul 2015Oct 2015Prosecution
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Abstract

A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.

Claims

6 · 1 independent · depth 2
123456
6 granted claims

Classifications

3 codes
IPC · International Patent Classification
Section G — Physics
  • G01B7/012
  • G01B5/012
  • G01B21/04

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Pendency
1.6 y
578 days filing → grant
Office actions
1
non-final + final
Responses
1
no RCE
Examiner
Bryan Bui
art unit 2865 · TC 2800
Citations: 20 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20140144033 A129 May 2014

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