A beam imaging sensor comprising:na sensor body, wherein the sensor body has a top end and a bottom end, the top end having at least one channel formed therein;a Faraday cup located within the at least one channel, the Faraday cup being positioned to receive at least a portion of an electron, or ion, beam;an inner slit disc and an outer slit disc positioned at the top end of the at least one channel so as to be positioned above the Faraday cup, the inner and outer slit discs being able to nest together to form a slit there between and where the slit so formed permits passage of at least a portion of an electron, or ion, beam to the Faraday cup located there below; andat least one conductive lead in electrical communication with the Faraday cup, the at least one conductive lead being able to conduct an electrical signal generated by the portion of the beam that comes into contact with the Faraday cup,wherein the combination of the Faraday cup, the inner slit disc and the outer slit disc form a beam path from the outside of the beam imaging sensor to the Faraday cup that is parallel to the central axis of the cylindrically-shaped sensor body such that the portion of the electron, or ion, beam must be parallel to the central axis of the cylindrically-shaped sensor body to enter the beam path.
›69.↳ 68The beam imaging sensor of claim 68, wherein the beam imaging sensor further comprises:nan electronics enclosure, wherein the electronics enclosure ha…d2+6
The beam imaging sensor of claim 68, wherein the beam imaging sensor further comprises:nan electronics enclosure, wherein the electronics enclosure has a top end and a bottom end, the top end of the electronics enclosure being coupled to the bottom end of the sensor body.
›70.↳ 69The beam imaging sensor of claim 69, wherein the beam imaging sensor further comprises:na clamp ring body and a lower clamp ring, wherein the clamp ri…d3+3
The beam imaging sensor of claim 69, wherein the beam imaging sensor further comprises:na clamp ring body and a lower clamp ring, wherein the clamp ring body and the clamp ring are coupled to one another and together have a top end and a bottom end, the top end of the coupled structure being coupled to the bottom end of the electronics enclosure.
›79.↳ 70The beam imaging sensor of claim 70, wherein the clamp ring body and lower clamp ring are independently formed from a metal or metal alloy.d4
The beam imaging sensor of claim 70, wherein the clamp ring body and lower clamp ring are independently formed from a metal or metal alloy.
›80.↳ 70The beam imaging sensor of claim 70, wherein the clamp ring body and lower clamp ring are independently formed from a corrosion resistant metal or cor…d4
The beam imaging sensor of claim 70, wherein the clamp ring body and lower clamp ring are independently formed from a corrosion resistant metal or corrosion resistant metal alloy.
›81.↳ 70The beam imaging sensor of claim 70, wherein the clamp ring body and lower clamp ring are independently formed from aluminum, titanium, stainless stee…d4
The beam imaging sensor of claim 70, wherein the clamp ring body and lower clamp ring are independently formed from aluminum, titanium, stainless steel, martensitic stainless steel, duplex and/or super duplex stainless steel; high austenitic alloys, nickel-based alloys, and/or titanium alloys.
›77.↳ 69The beam imaging sensor of claim 69, wherein the electronics enclosure is formed from an electrically non-conductive material.d3
The beam imaging sensor of claim 69, wherein the electronics enclosure is formed from an electrically non-conductive material.
›78.↳ 69The beam imaging sensor of claim 69, wherein the electronics enclosure is formed from an organic-based or inorganic-based insulating compound, a glass…d3
The beam imaging sensor of claim 69, wherein the electronics enclosure is formed from an organic-based or inorganic-based insulating compound, a glass-epoxy insulator, a ceramic insulator, or any combination of two or more thereof.
›71.↳ 68The beam imaging sensor of claim 68, wherein the sensor body is formed from a metal or metal alloy.d2
The beam imaging sensor of claim 68, wherein the sensor body is formed from a metal or metal alloy.
›72.↳ 68The beam imaging sensor of claim 68, wherein the sensor body is formed from aluminum, titanium, stainless steel, martensitic stainless steel, duplex a…d2
The beam imaging sensor of claim 68, wherein the sensor body is formed from aluminum, titanium, stainless steel, martensitic stainless steel, duplex and/or super duplex stainless steel; high austenitic alloys, nickel-based alloys, or titanium alloys.
›73.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is formed from a conductive metal or conductive metal alloy.d2
The beam imaging sensor of claim 68, wherein the Faraday cup is formed from a conductive metal or conductive metal alloy.
›74.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is formed from copper, silver, gold, platinum, aluminum, or a conductive metal alloy that…d2
The beam imaging sensor of claim 68, wherein the Faraday cup is formed from copper, silver, gold, platinum, aluminum, or a conductive metal alloy that contains one or more of copper, silver, gold, platinum, or aluminum.
›75.↳ 68The beam imaging sensor of claim 68, wherein the inner and outer slit discs are formed from a metal, metal alloy, or refractory material.d2
The beam imaging sensor of claim 68, wherein the inner and outer slit discs are formed from a metal, metal alloy, or refractory material.
›76.↳ 68The beam imaging sensor of claim 68, wherein the inner and outer slit discs are formed from tungsten, molybdenum, hafnium, or an alloy that contains o…d2
The beam imaging sensor of claim 68, wherein the inner and outer slit discs are formed from tungsten, molybdenum, hafnium, or an alloy that contains one or more of tungsten, molybdenum, or hafnium.
›82.↳ 68The beam imaging sensor of claim 68, wherein the slit formed between the inner and outer slit discs has a width of less than or equal to 0.010 inches.d2
The beam imaging sensor of claim 68, wherein the slit formed between the inner and outer slit discs has a width of less than or equal to 0.010 inches.
›83.↳ 68The beam imaging sensor of claim 68, wherein the slit formed between the inner and outer slit discs has a width of less than or equal to 0.005 inches.d2
The beam imaging sensor of claim 68, wherein the slit formed between the inner and outer slit discs has a width of less than or equal to 0.005 inches.
›84.↳ 68The beam imaging sensor of claim 68, wherein the slit formed between the inner and outer slit discs has a width of less than or equal to 0.002 inches.d2
The beam imaging sensor of claim 68, wherein the slit formed between the inner and outer slit discs has a width of less than or equal to 0.002 inches.
›85.↳ 68The beam imaging sensor of claim 68, wherein the slit is substantially circular in shape.d2
The beam imaging sensor of claim 68, wherein the slit is substantially circular in shape.
›86.↳ 68The beam imaging sensor of claim 68, wherein the slit is polygonal in shape.d2
The beam imaging sensor of claim 68, wherein the slit is polygonal in shape.
›87.↳ 68The beam imaging sensor of claim 68, wherein the slit is elliptical in shape.d2
The beam imaging sensor of claim 68, wherein the slit is elliptical in shape.
›88.↳ 68The beam imaging sensor of claim 68, wherein the inner slit disc and the outer slit disc are secured to the at least one channel in the top end of the…d2
The beam imaging sensor of claim 68, wherein the inner slit disc and the outer slit disc are secured to the at least one channel in the top end of the sensor body via an inner clamp ring and an outer clamp ring, where in the inner clamp ring and the outer clamp ring are secured to respective surfaces of the sensor body via respective threaded arrangements.
›89.↳ 68The beam imaging sensor of claim 68, wherein the inner slit disc and the outer slit disc are secured to the at least one channel in the top end of the…d2
The beam imaging sensor of claim 68, wherein the inner slit disc and the outer slit disc are secured to the at least one channel in the top end of the sensor body via an inner clamp ring and an outer clamp ring, where in the inner clamp ring and the outer clamp ring are secured to respective surfaces of the sensor body via respective clamps.
›90.↳ 68The beam imaging sensor of claim 68, wherein the inner slit disc and the outer slit disc are secured to the at least one channel in the top end of the…d2+2
The beam imaging sensor of claim 68, wherein the inner slit disc and the outer slit disc are secured to the at least one channel in the top end of the sensor body via an inner clamp ring and an outer clamp ring, where in the inner clamp ring and the outer clamp ring are secured to respective surfaces of the sensor body via a combination of one threaded arrangement and one clamp arrangement.
›91.↳ 90The beam imaging sensor of claim 90, wherein the clamp arrangement is utilized to secure the outer clamp ring to the sensor body and the threaded arra…d3
The beam imaging sensor of claim 90, wherein the clamp arrangement is utilized to secure the outer clamp ring to the sensor body and the threaded arrangement is utilized to secure the inner clamp ring to the sensor body.
›92.↳ 90The beam imaging sensor of claim 90, wherein the clamp arrangement is utilized to secure the inner clamp ring to the sensor body and the threaded arra…d3
The beam imaging sensor of claim 90, wherein the clamp arrangement is utilized to secure the inner clamp ring to the sensor body and the threaded arrangement is utilized to secure the outer clamp ring to the sensor body.
›93.↳ 68The beam imaging sensor of claim 68, wherein the sensor body of the beam imaging sensor is formed in any geometric shape selected from circular, polyg…d2+2
The beam imaging sensor of claim 68, wherein the sensor body of the beam imaging sensor is formed in any geometric shape selected from circular, polygonal, irregular polygonal, elliptical, arcuate, or semicircular.
›94.↳ 93The beam imaging sensor of claim 93, wherein the sensor body of the beam imaging sensor is circular in shape.d3
The beam imaging sensor of claim 93, wherein the sensor body of the beam imaging sensor is circular in shape.
›95.↳ 93The beam imaging sensor of claim 93, wherein the sensor body of the beam imaging sensor is polygonal in shape.d3
The beam imaging sensor of claim 93, wherein the sensor body of the beam imaging sensor is polygonal in shape.
›96.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup comprises a cross-sectiona…d2
The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup comprises a cross-sectional profile similar in shape to a human nose.
›97.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when …d2
The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when viewed from the surface through which the electron, or ion, beam enters, and wherein the cross-section of the modified Faraday cup is formed from one substantially straight internal sidewall, one sloped internal sidewall, a sloped bottom, and an open top.
›98.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when …d2
The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when viewed from the surface through which the electron, or ion, beam enters, and wherein the cross-section of the modified Faraday cup is formed from one substantially straight internal sidewall, one sloped internal sidewall, a sloped bottom, and an open top, and wherein the one sloped internal sidewall has a slope of between about 5 degrees and about 25 degrees.
›99.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when …d2
The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when viewed from the surface through which the electron, or ion, beam enters, and wherein the cross-section of the modified Faraday cup is formed from one substantially straight internal sidewall, one sloped internal sidewall, a sloped bottom, and an open top, and wherein the sloped bottom has a slope of between about 5 degrees and about 35 degrees.
›100.↳ 68The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when …d2
The beam imaging sensor of claim 68, wherein the Faraday cup is a modified Faraday cup and wherein the modified Faraday cup is circular in shape when viewed from the surface through which the electron, or ion, beam enters, and wherein the cross-section of the modified Faraday cup is formed from one substantially straight internal sidewall, one sloped internal sidewall, a sloped bottom, and an open top, and wherein the modified Faraday cup has a minimum depth of at least about 0.25 inches.
›101.↳ 68The beam imaging sensor of claim 68, wherein the inner slit disc has at least one protrusion formed thereon so as to permit orientation of the inner s…d2+2
The beam imaging sensor of claim 68, wherein the inner slit disc has at least one protrusion formed thereon so as to permit orientation of the inner slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding notch designed to receive the at least one protrusion of the inner slit disc.
›102.↳ 101The beam imaging sensor of claim 101, wherein the outer slit disc has at least one protrusion formed thereon so as to permit orientation of the outer …d3
The beam imaging sensor of claim 101, wherein the outer slit disc has at least one protrusion formed thereon so as to permit orientation of the outer slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding notch designed to receive the at least one protrusion of the outer slit disc.
›108.↳ 101The beam imaging sensor of claim 101, wherein the outer slit disc has at least one notch formed thereon so as to permit orientation of the outer slit …d3
The beam imaging sensor of claim 101, wherein the outer slit disc has at least one notch formed thereon so as to permit orientation of the outer slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding notch protrusion designed to receive the at least one notch of the outer slit disc.
›103.↳ 68The beam imaging sensor of claim 68, wherein the outer slit disc has at least one protrusion formed thereon so as to permit orientation of the outer s…d2
The beam imaging sensor of claim 68, wherein the outer slit disc has at least one protrusion formed thereon so as to permit orientation of the outer slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding notch designed to receive the at least one protrusion of the outer slit disc.
›104.↳ 68The beam imaging sensor of claim 68, wherein the outer slit disc has at least one notch formed thereon so as to permit orientation of the outer slit d…d2
The beam imaging sensor of claim 68, wherein the outer slit disc has at least one notch formed thereon so as to permit orientation of the outer slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding protrusion designed to receive the at least one notch of the outer slit disc.
›105.↳ 68The beam imaging sensor of claim 68, wherein the inner slit disc has at least one notch formed therein so as to permit orientation of the inner slit d…d2+2
The beam imaging sensor of claim 68, wherein the inner slit disc has at least one notch formed therein so as to permit orientation of the inner slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding protrusion designed to fit into the at least one notch of the inner slit disc.
›106.↳ 105The beam imaging sensor of claim 105, wherein the outer slit disc has at least one protrusion formed thereon so as to permit orientation of the outer …d3
The beam imaging sensor of claim 105, wherein the outer slit disc has at least one protrusion formed thereon so as to permit orientation of the outer slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding notch designed to receive the at least one protrusion of the outer slit disc.
›107.↳ 105The beam imaging sensor of claim 105, wherein the outer slit disc has at least one notch formed thereon so as to permit orientation of the outer slit …d3
The beam imaging sensor of claim 105, wherein the outer slit disc has at least one notch formed thereon so as to permit orientation of the outer slit disc into the at least one channel of the sensor body in only one manner due to the at least one channel formed therein having a corresponding protrusion designed to receive the at least one notch of the outer slit disc.
›109.↳ 68The beam imaging sensor of claim 68, wherein the inner and outer slit discs have at least one set of alignment indicia formed thereon and wherein the …d2+1
The beam imaging sensor of claim 68, wherein the inner and outer slit discs have at least one set of alignment indicia formed thereon and wherein the at least one set of alignment indicia permit a user to accurately align the inner and outer slit discs in one particular orientation.
›110.↳ 109The beam imaging sensor of claim 109, wherein the at least one set of alignment indicia is selected from any suitable combination of two or more dots,…d3
The beam imaging sensor of claim 109, wherein the at least one set of alignment indicia is selected from any suitable combination of two or more dots, two or more circles, two or more Xs, two or more like or different letters, two or more like or different numbers, or two or more arrows.
›111.↳ 68The beam imaging sensor of claim 68, wherein the slit formed by the inner slit disc and the outer slit disc has at least two different slit widths alo…d2
The beam imaging sensor of claim 68, wherein the slit formed by the inner slit disc and the outer slit disc has at least two different slit widths along the length of the slit.