USPatentGranted
B2

Beam imaging sensor

Granted 31 Mar 2015 · 4 office actions

Life of the patent

4 dated events
⤢ drag to zoomJul 2012Jan 2013Jul 2013Jan 2014Jul 2014Jan 2015Prosecution
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Abstract

The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature.

Claims

111 · 4 independent · depth 4
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111 granted claims

Classifications

5 codes
IPC · International Patent Classification
Section G — Physics
  • G01T1/29
USPC · US Patent Classification
250/300250/397250/426.R250/354

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File wrapper

Pendency
2.0 y
747 days filing → grant
Office actions
2
non-final + final
Responses
2
1 RCE
Examiner
Phillip A Johnston
art unit 2881 · TC 2800
Citations: 25 back · 0 forward

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Priority chain

2 priority documents
Priority
14 May 2012
earliest claimed
›Priority documents — 2
TypeDocumentDate
provisionalUS 6164662714 May 2012
related publicationUS 20130299700 A114 Nov 2013

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Citations

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