›20.↳ 19The process as claimed in claim 19, wherein the surface of the material onto which the mixture is applied is polished.d2
The process as claimed in claim 19, wherein the surface of the material onto which the mixture is applied is polished.
›21.↳ 19The material as claimed in claim 19, wherein the resin is an epoxy or silicone resin.d2
The material as claimed in claim 19, wherein the resin is an epoxy or silicone resin.
›22.↳ 19The material as claimed in claim 19, wherein the thickness of the layer is between 10 μm and 5 mm.d2
The material as claimed in claim 19, wherein the thickness of the layer is between 10 μm and 5 mm.
›23.↳ 19The material as claimed in claim 19, wherein the rare-earth halide comprises lanthanum chloride or lanthanum bromide.d2
The material as claimed in claim 19, wherein the rare-earth halide comprises lanthanum chloride or lanthanum bromide.
›24.↳ 19The material as claimed in claim 19, wherein its surface comprises a region that is not coated by the layer.d2
The material as claimed in claim 19, wherein its surface comprises a region that is not coated by the layer.
›25.↳ 19The material as claimed in claim 19, wherein the pigment and the layer which contains it are black to the naked eye.d2
The material as claimed in claim 19, wherein the pigment and the layer which contains it are black to the naked eye.
›26.↳ 19The material as claimed in claim 19, wherein the pigment and the layer that contains it are white to the naked eye.d2
The material as claimed in claim 19, wherein the pigment and the layer that contains it are white to the naked eye.
›27.↳ 19The material as claimed in claim 19, wherein the pigment and the layer which contains it are gray to the naked eye.d2
The material as claimed in claim 19, wherein the pigment and the layer which contains it are gray to the naked eye.
›28.↳ 19The material as claimed in claim 19, wherein the layer comprises 0.01 to 20% by weight of pigment.d2
The material as claimed in claim 19, wherein the layer comprises 0.01 to 20% by weight of pigment.
›29.↳ 19The material as claimed in claim 19, wherein the layer is partially transparent.d2
The material as claimed in claim 19, wherein the layer is partially transparent.
›30.↳ 19The material as claimed in claim 19, wherein the interface between the layer and the scintillator material has been polished.d2
The material as claimed in claim 19, wherein the interface between the layer and the scintillator material has been polished.
›31.↳ 19The material as claimed in claim 19, wherein the resin is an epoxy or silicone resin, the thickness of the layer is between 10 μm and 5 mm, the rare-e…d2+5
The material as claimed in claim 19, wherein the resin is an epoxy or silicone resin, the thickness of the layer is between 10 μm and 5 mm, the rare-earth halide comprises lanthanum chloride or lanthanum bromide, and its surface comprises a region that is not coated by the layer.
›32.↳ 31The material as claimed in claim 31, wherein the interface between the layer and the scintillator material has been polished.d3
The material as claimed in claim 31, wherein the interface between the layer and the scintillator material has been polished.
›33.↳ 31An ionizing-radiation detector comprising the scintillator material from claim 31, said scintillator material being coupled, via a region of the surfa…d3
An ionizing-radiation detector comprising the scintillator material from claim 31, said scintillator material being coupled, via a region of the surface that is not coated by said layer, to a photodetector.
›34.↳ 31A process for manufacturing the scintillator material from claim 31, comprising the application of a homogeneous mixture of an adhesive resin and a pi…d3+2
A process for manufacturing the scintillator material from claim 31, comprising the application of a homogeneous mixture of an adhesive resin and a pigment to the surface of the scintillator material containing less than 1% by weight of water.
›35.↳ 34The process as claimed in claim 34, wherein the mixture contains less than 100 ppm by weight of water.d4
The process as claimed in claim 34, wherein the mixture contains less than 100 ppm by weight of water.
›36.↳ 34The process as claimed in claim 34, wherein the surface of the material onto which the mixture is applied is polished.d4
The process as claimed in claim 34, wherein the surface of the material onto which the mixture is applied is polished.
›37.↳ 19An ionizing-radiation detector comprising the scintillator material from claim 19, said scintillator material being coupled, via a region of the surfa…d2+1
An ionizing-radiation detector comprising the scintillator material from claim 19, said scintillator material being coupled, via a region of the surface that is not coated by said layer, to a photodetector.
›38.↳ 37A gamma camera comprising the detector from claim 37.d3
A gamma camera comprising the detector from claim 37.
›39.↳ 19The process as claimed in claim 19, wherein the mixture contains less than 100 ppm by weight of water.d2
The process as claimed in claim 19, wherein the mixture contains less than 100 ppm by weight of water.