USPatentGranted
B2

Tire chip and tear test apparatus and method

Granted 2 Oct 2012 · 2 office actions

Life of the patent

3 dated events
⤢ drag to zoomJan 2011Apr 2011Jul 2011Oct 2011Jan 2012Apr 2012Jul 2012Oct 2012Prosecution
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Abstract

A tire testing apparatus that includes a test drum and at least one tire station. The test drum has an outer radial surface and a plurality of sectioned plates having outer radial test surfaces, wherein the plurality of sectioned plates mount on the outer radial surface of the test drum. The tire testing apparatus further includes at least one tire station having a selected tire with a tread, wherein the tread of the selected tire presses against the outer radial test surface of the plurality of sectional plates, and wherein the at least one tire station applies a force against the tread of the selected tire. Further, a tire testing method includes providing a selected tire having a circumferential tread and moving the selected tire against a rotating test drum having a plurality of sectional plates having a test surface. Further, the method includes maintaining contact between the selected tire and the plurality of sectional plates for a selected period of time, moving the selected tire away from the test drum, and evaluating the tread for wear.

Claims

20 · 3 independent · depth 3
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20 granted claims

Classifications

2 codes
IPC · International Patent Classification
Section G — Physics
  • G01M17/02
USPC · US Patent Classification
73/146

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File wrapper

Pendency
1.6 y
599 days filing → grant
Office actions
1
non-final + final
Responses
1
1 RCE
Examiner
Andre Allen
art unit 2856 · TC 2800
Citations: 27 back · 1 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20120204633 A116 Aug 2012

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