Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program
Granted 10 Jan 2012 · 10 office actions
Assignee: Semiconductor Energy Laboratory
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Tatsuji Nishijima, Masahiko Hayakawa · Examiner: Jayesh A Patel · AU 2624 · TC 2600
Life of the patent
21 dated eventsAbstract
In the case where a digital camera is used for evaluating a display quality of an image display panel, moire is generated due to a shift of a pixel pitch between a pixel of a panel and a pixel of a digital camera, and thus, a great influence is given as measurement deviation. The present invention carries out a panel display quality evaluation at low cost and short time with relieved influence of moire by treating a value, which is obtained by recognizing a coordinate of a panel pixel in a shot image based on an image for detecting a coordinate and positional information thereof with high accuracy and by calculating average luminance by panel pixel unit based on a center position of a coordinate, as representative luminance in each pixel of the panel, in a panel evaluation method of shooting an image display panel with a digital camera.
Claims
38 · 5 independent · depth 4Classifications
5 codes- G06K9/40
Claim changes
SoonSee which claims were amended, added or cancelled during examination, with every added and removed word marked.
The published claims of this patent are not paired with the granted ones in what we hold.
File wrapper
See the full prosecution history — every USPTO and applicant action on this file, in order.
Log in to unlockTerm & fees
See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.
Log in to unlockPriority chain
1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20050232476 A1 | 20 Oct 2005 |
Validity challenges
See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.
Log in to unlockCitations
See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.
Log in to unlock