Radiation image device

A method of manufacturing a radiation imaging device, the method comprising:nproviding a wiring substrate having a plurality of penetrating holes formed therein;forming an adhesive material on the wiring substrate at locations other than where the penetrating holes are formed;positioning a radiation imaging element above the wiring substrate such that the adhesive material is located between the radiation imaging element and the wiring substrate, the radiation imaging element comprising a solid-state imaging element;creating a pressure differential between a space located above the radiation imaging element and a space located below the radiation imaging element; andusing the pressure differential to cause the radiation imaging element to be pressed against the wiring substrate and to cause the adhesive material to be spread between the radiation imaging element and the wiring substrate,wherein the solid-state imaging element comprises a first solid-state imaging element, the wiring substrate is formed to comprise a step located at a different height than a portion of the wiring substrate above which the first solid-state imaging element is positioned, and a second solid-state imaging element is positioned above a surface of the wiring substrate differing in height due to the step as compared to the portion of the wiring substrate above which the first solid-state imaging element is positioned.

A radiation imaging device comprising:na wiring substrate having a plurality of penetrating holes formed therein;an adhesive material disposed on the wiring substrate; anda radiation imaging element positioned above the wiring substrate such that the adhesive material is located between the radiation imaging element and the wiring substrate, the radiation imaging element comprising a solid-state imaging element;wherein the penetrating holes are configured to allow, during manufacturing of the radiation imaging device, (i) creation of a pressure differential between a space located above the radiation imaging element and a space located below the radiation imaging element, and (ii) use of the pressure differential to cause the radiation imaging element to be pressed against the wiring substrate and to cause the adhesive material to be spread between the radiation imaging element and the wiring substrate, andwherein the solid-state imaging element comprises a first solid-state imaging element, the wiring substrate comprises a step located at a different height than a portion of the wiring substrate above which the first solid-state imaging element is positioned, and a second solid-state imaging element is positioned above a surface of the wiring substrate differing in height due to the step as compared to the portion of the wiring substrate above which the first solid-state imaging element is positioned.