Time lag measuring device, distance measuring apparatus and distance measuring method
Granted 7 Dec 2010 · 2 office actions
Assignee: Topcon Corporation
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Yoshikatsu Tokuda, Masahiro Ohishi, Fumio Ohtomo · Examiner: Phung M Chung · AU 2117 · TC 2100
Life of the patent
9 dated eventsAbstract
In measuring a certain time lag between generations of two pulse signals, a time lag measuring device prevents errors in measurement results even with an error in two reference signals for measuring the time lag. The device measures a time lag between a start signal M 1 and a stop signal M 2 and includes a reference signal generating section 41 generating two reference signals S 1 , S 2 having a phase difference π/2, and an amplitude detecting section 42 detects amplitudes A 11 , A 12 and A 21 , A 22 of the reference signals S 1 , S 2 at generation timings for the start signal M 1 and the stop signal M 2 , a phase difference detecting section 43 calculating a phase _ of the reference signals S according to each set of the amplitudes (A 11 , A 12 ) and (A 21 , A 22 ), and a correcting section 46 correcting the calculated phase using correction data for error correction in the reference signals S 1 , S 2.
Claims
34 · 5 independent · depth 3Classifications
3 codes- G06K5/04
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20090235127 A1 | 17 Sep 2009 |
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