USPatentGranted
B2

Time lag measuring device, distance measuring apparatus and distance measuring method

Granted 7 Dec 2010 · 2 office actions

Life of the patent

9 dated events
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Abstract

In measuring a certain time lag between generations of two pulse signals, a time lag measuring device prevents errors in measurement results even with an error in two reference signals for measuring the time lag. The device measures a time lag between a start signal M 1 and a stop signal M 2 and includes a reference signal generating section 41 generating two reference signals S 1 , S 2 having a phase difference π/2, and an amplitude detecting section 42 detects amplitudes A 11 , A 12 and A 21 , A 22 of the reference signals S 1 , S 2 at generation timings for the start signal M 1 and the stop signal M 2 , a phase difference detecting section 43 calculating a phase _ of the reference signals S according to each set of the amplitudes (A 11 , A 12 ) and (A 21 , A 22 ), and a correcting section 46 correcting the calculated phase using correction data for error correction in the reference signals S 1 , S 2.

Claims

34 · 5 independent · depth 3
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34 granted claims

Classifications

3 codes
IPC · International Patent Classification
Section G — Physics
  • G06K5/04
USPC · US Patent Classification
714/700714/699

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File wrapper

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Pendency
4.5 y
1,639 days filing → grant
Office actions
1
non-final + final
Responses
1
1 RCE
Examiner
Phung M Chung
art unit 2117 · TC 2100
Citations: 22 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20090235127 A117 Sep 2009

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