Infrared detector, infrared detecting apparatus, and method of manufacturing infrared detector
Granted 30 Nov 2010 · no office action yet
Current assignee: Mitsubishi Heavy Industries · originally Seoul National University
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Inventors: Masahito Yamaguchi, Koichi Tani, Yo Watanabe, Masahiro Kato +1 · Examiner: Kiho Kim
Life of the patent
7 dated eventsAbstract
An infrared detector comprises: a reflection portion transmitting far- and middle-infrared rays and reflecting near-infrared and visible rays; a photo-current generating portion having a quantum well structure in which electrons are excited by the far- and middle-infrared rays having passed through the reflection portion so as to generate photo-current; a light emitting portion having a quantum well structure into which electrons of the photo-current generated by the photo-current generating portion are injected and the electrons thus injected thereinto are recombined with holes, thus emitting near-infrared and visible rays; and a photo-detecting portion detecting the near-infrared and visible rays emitted from the light emitting portion, and detecting the near-infrared and visible rays emitted from the light emitting portion and reflected by the reflection portion. The reflection portion, the photo-current generating portion, and the light emitting portion are made of group III-V compound semiconductors layered on a semiconductor substrate.
Claims
18 · 3 independent · depth 3Classifications
2 codes- G01J5/20
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20090272903 A1 | 5 Nov 2009 |
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