USPatentGranted
B2

Lithographic projection apparatus, purge gas supply system and gas purging method

Granted 7 Sep 2010 · 4 office actions

Life of the patent

11 dated events
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Abstract

A lithographic projection apparatus ( 1 ) includes a support configured to support a patterning device (MA), the patterning device configured to pattern the projection beam according to a desired pattern. The apparatus has a substrate (W) table configure to hold a substrate, a projection system configured to project the patterned beam onto a target portion of the substrate. The apparatus also has a purge gas supply system ( 100 ) configured to provide a purge gas near a surface of a component of the lithographic projection apparatus. The purge gas supply system ( 100 ) includes a purge gas mixture generator ( 120 ) configured to generate a purge gas mixture which includes at least one purging gas and moisture. The purge gas mixture generator has a moisturizer ( 150 ) configured to add the moisture to the purge gas and a purge gas mixture outlet ( 130 ) connected to the purge gas mixture generator ( 120 ) configured to supply the purge gas mixture near the surface.

Claims

73 · 9 independent · depth 5
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73 granted claims

Classifications

10 codes
IPC · International Patent Classification
Section B — Performing operations; transporting
  • B01D53/22
Section G — Physics
  • G03B21/14
USPC · US Patent Classification
95/5296/896/10355/5396/11355/3096/12261/101

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File wrapper

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Pendency
6.1 y
2,239 days filing → grant
Office actions
2
non-final + final
Responses
3
2 RCE
Examiner
Jason M Greene
art unit 1797 · TC 1700
Citations: 79 back · 0 forward

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Term & fees

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20070030463 A18 Feb 2007

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