USPatentGranted
B2

Operating microscope having an arm frame

Granted 29 Dec 2009 · 2 office actions

Life of the patent

10 dated events
⤢ drag to zoom20062008201020122014201620182020202220242026ProsecutionTerm & fees
ProsecutionTerm & feeshover for detail · click to open

Abstract

An operating microscope includes a base set on a floor surface, a post held for rotation around a vertical rotation axis with respect to the base, a horizontal motion arm held for rotation around a first horizontal rotation axis with respect to the post, a vertical motion arm held for rotation around a second horizontal rotation axis with respect to the horizontal motion arm, a lens barrel portion supported by the vertical motion arm, an elastic member which is provided between the post and the horizontal motion arm and cancels an angular moment around the horizontal motion arm, a fulcrum which is provided on the horizontal motion arm and receives a force from the elastic member, and a fulcrum moving mechanism configured to shift the position of the fulcrum in a direction substantially perpendicular to a longitudinal direction of the horizontal motion arm.

Claims

7 · 2 independent · depth 2
1234567
7 granted claims

Classifications

5 codes
IPC · International Patent Classification
Section G — Physics
  • G02B21/00
USPC · US Patent Classification
359/384248/648600/102248/123.11

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

⤢ drag to zoomJul 2006Jan 2007Jul 2007Jan 2008Jul 2008Jan 2009Jul 2009Jan 2010USPTOApplicantRestriction requirementNon-final rejectionResponse after non-finalNotice of allowanceRequest for continued examination
USPTOApplicanthover for detail · click to open
Pendency
3.3 y
1,215 days filing → grant
Office actions
1
after a restriction
Responses
1
1 RCE
Examiner
Arnel C Lavarias
art unit 2872 · TC 2800
Citations: 9 back · 0 forward

See the full prosecution history — every USPTO and applicant action on this file, in order.

Log in to unlock

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20060291045 A128 Dec 2006

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock