USPatentGranted
B2

Layered product and capacitor

Granted 13 Apr 2004 · 8 office actions

Current assignee: Matsushita Electric Industrial Co., Ltd. · originally Panasonic

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Kazuyoshi Honda, Shinichi Suzawa, Noriyasu Echigo, Masaru Odagiri +1 · Examiner: Dean A. Reichard

Life of the patent

16 dated events
⤢ drag to zoom20022004200620082010201220142016201820202022ProsecutionTerm & fees
ProsecutionTerm & feeshover for detail · click to open

Abstract

A layered product comprising a plurality of deposition units, each comprising a thin resin layer and a thin metal layer wherein the surface roughness of the thin resin layer is 0.1 m or below, a protrusion forming component is not added to the thin resin layer or the surface roughness of the thin metal layer is 0.1 m or below. The surface characteristics are improved regardless of the thickness of the layered product and the requirement of high performance thin film can be satisfied because the layered product contains no foreign matter. The layered product is suitably applicable to electronic parts, e.g., a capacitor, especially a chip capacitor.

Classifications

4 codes
IPC · International Patent Classification
Section H — Electricity
  • H01G4/06
USPC · US Patent Classification
361/311361/309361/301.4

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

⤢ drag to zoomApr 2002Jul 2002Oct 2002Jan 2003Apr 2003Jul 2003Oct 2003Jan 2004Apr 2004USPTOApplicantNon-final rejectionResponse after non-finalFinal rejectionResponse after finalResponse after non-finalRequest for continued examination
USPTOApplicanthover for detail · click to open
Pendency
2.0 y
739 days filing → grant
Office actions
4
non-final + final
Responses
4
2 RCE
Interviews
1
examiner interview summaries
Examiner
Dean A. Reichard
art unit —
Citations: 20 back · 0 forward

See the full prosecution history — every USPTO and applicant action on this file, in order.

Log in to unlock

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20020141137 A13 Oct 2002

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock